Structural, morphological and hydrogen sensing studies on pulsed laser deposited nanostructured palladium thin films

Journal of Physics D: Applied Physics

Volumn 39, Issue 13, 2006, Pages 2791-2795

  Kumar, M Krishna ^a   Rao, M S Ramachandra ^a   Ramaprabhu, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRIC RESISTANCE; HYDROGENATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

ELECTRICAL RESISTANCE MEASUREMENTS; HYDROGEN LOADING; HYDROGEN SENSING; QUARTZ SUBSTRATES;

PULSED LASER DEPOSITION;

EID: 33745316325     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/13/023     Document Type: Article

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