Exchange bias in ferromagnetic/antiferromagnetic bilayers under the stress field

Wuli Xuebao/Acta Physica Sinica

Volumn 55, Issue 6, 2006, Pages 3032-3037

  Pan, Jing ^a   Tao, Yong Chun ^b   Hu, Jing Guo ^a  

^a YANGZHOU UNIVERSITY   (China)

^b NANJING NORMAL UNIVERSITY   (China)

Author keywords

Exchange bias; FM AFM bilayers; Pinning angle; Stress field

Indexed keywords

EID: 33745303352     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)