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Volumn 15, Issue 4-8, 2006, Pages 542-547
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Comparison of MWPCVD diamond growth at low and high process gas pressures
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Author keywords
CVD deposition; Diamond growth and characterisation; High growth rate; In situ analysis
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Indexed keywords
CONCENTRATION (PROCESS);
INTERFEROMETRY;
MASS SPECTROMETRY;
MICROWAVE DEVICES;
PLASMA APPLICATIONS;
PRESSURE EFFECTS;
CVD DEPOSITION;
DIAMOND GROWTH AND CHARACTERISATION;
HIGH GROWTH RATE;
IN-SITU ANALYSIS;
VAPOR DEPOSITION;
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EID: 33745279139
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2006.01.010 Document Type: Article |
Times cited : (32)
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References (12)
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