Reliability and validity of the Severe Impairment Battery (SIB) in Korean dementia patients

Journal of Korean Medical Science

Volumn 21, Issue 3, 2006, Pages 506-517

  Ahn, Inn Sook ^a   Kim, Ji Hae ^b   Ku, Hyoung Mo ^c   Saxton, Judith ^d   Doh, Kwan Kim ^b,e  

^a Samsung Medical Center   (South Korea)

^b Sungkyunkwan University School of Medicine   (South Korea)

^c University of Pittsburgh ^*  (South Korea)

^d UNIVERSITY OF PITTSBURGH   (United States)

^e Sungkyunkwan University   (South Korea)

Author keywords

Dementia; Neurophysiological Tests; Reliability and Validity; Reproducibility of Results; ROC Curve; Severe Impairment Battery

Indexed keywords

EID: 33745254748     PISSN: 10118934     EISSN: 15986357     Source Type: Journal    
DOI: 10.3346/jkms.2006.21.3.506     Document Type: Article

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