Triple-biprism electron interferometry

Journal of Applied Physics

Volumn 99, Issue 11, 2006, Pages

  Harada, Ken ^c   Matsuda, Tsuyoshi ^c   Tonomura, Akira ^c   Akashi, Tetsuya ^a   Togawa, Yoshihiko ^b  

^a HITACHI LTD   (Japan)

^b Japan Science and Technology Agency   (Japan)

^c Institute of Physical and Chemical Research ^*

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ELECTRODES; FIELD EMISSION MICROSCOPES; INCANDESCENT LAMPS; LIGHT INTERFERENCE; OPTICAL INSTRUMENT LENSES;

FIELD EMISSION ELECTRON MICROSCOPE; FILAMENT ELECTRODE; FRINGE SPACING; TRIPLE-BIPRISM ELECTRON INTERFEROMETRY;

INTERFEROMETRY;

EID: 33745235500     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2198987     Document Type: Article

References (10)

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