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Volumn , Issue , 2005, Pages 2637-2640
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Environment-independent mask estimation for missing-feature reconstruction
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Author keywords
[No Author keywords available]
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Indexed keywords
DATABASE SYSTEMS;
ESTIMATION;
FEATURE EXTRACTION;
MASKS;
ROBUSTNESS (CONTROL SYSTEMS);
SPECTRUM ANALYSIS;
MASK ESTIMATION;
MISSING-FEATURE RECONSTRUCTION;
RECOGNITION ACCURACY;
SPECTRAL VARIATIONS;
SPEECH RECOGNITION;
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EID: 33745200501
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (5)
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