Processing and modelling of short-offset seismic refraction - Coincident deep seismic reflection data sets in sedimentary basins: An approach for exploring the underlying deep crustal structures

Geophysical Journal International

Volumn 163, Issue 3, 2005, Pages 1112-1122

  Krishna, V Gopalak ^a   Rao, V Vijaya ^a  

^a NATIONAL GEOPHYSICAL RESEARCH INSTITUTE   (India)

Author keywords

Attenuation; Coincident seismic reflection and refraction data sets; Free surface multiples; Seismic modelling; Subcritical reflections; Velocity filtering

Indexed keywords

CRUSTAL STRUCTURE; MODELING; SEDIMENTARY BASIN; SEISMIC DATA; SEISMIC REFLECTION; SEISMIC REFRACTION;

ASIA; BENGAL; EURASIA; SOUTH ASIA;

EID: 33745196386     PISSN: 0956540X     EISSN: 1365246X     Source Type: Journal    
DOI: 10.1111/j.1365-246X.2005.02792.x     Document Type: Article

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