Study of thickness dependence on electrical properties of (Pb,La)TiO 3 thin films for memory applications

Integrated Ferroelectrics

Volumn 46, Issue , 2002, Pages 133-141

  Venkateswarlu, P ^a,b   Victor, P ^a   Krupanidhi, S B ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b INDIAN SPACE RESEARCH ORGANISATION   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; ELECTRIC POTENTIAL; EXCIMER LASERS; LASER ABLATION; LEAD COMPOUNDS; LEAKAGE CURRENTS; PERMITTIVITY; RANDOM ACCESS STORAGE; SEMICONDUCTING SILICON; TITANATE MINERALS;

CURRENT- VOLTAGE CHARACTERISTICS; EXCIMER LASER ABLATION; RANDOM ACCESS MEMORY; VOLTAGE DEPENDENCE;

FERROELECTRIC THIN FILMS;

EID: 33745181828     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580215391     Document Type: Article

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