The impact of ASIC devices on the SEU vulnerability of space-borne computers

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1685-1692

  Koga, R ^a   Crain, W R ^a   Crawford, K B ^a   Hansel, S J ^a   Pinkerton, S D ^a   Tsubota, T K ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745172923     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211354     Document Type: Article

References (6)

1. R. Koga, W.A. Kolasinski, and S. Imamoto, “Heavy Ion Induced Upsets in Semiconductor Devices,” IEEE Trans Nucl. Sci, NS-32, 159–162, 1985.
2. W.C. Schneider, Private communication.
3. P.J. Rudeck, Private communication.
4. J.C. Pickel and J.T. Blandford Jr., “CMOS RAM Cosmic-Ray-Induced-Error-Rate Analysis,” IEEE Trans Nucl. Sci, NS-28, 3962–3967, 1981.
5. J.H. Sokol, W.A. Kolasinski, M. Wong, R. Koga, R.V. Suhrke, and T.H. Frey, “Advantage of Advanced CMOS Over Advanced TTL in a Cosmic Ray Environment,” IEEE Trans Nucl. Sci, NS-34, 1338–1340, 1987.
6. R. Koga, K.B. Crawford, S.J. Hansel, B.M. Johnson, D.D. Lau, S.H. Penzin, S.D. Pinkerton, and M.C. Maher, “SEU and Latchup Tolerant Advanced CMOS Technology,” IEEE Trans Nucl. Sci, NS-37, 1869–1875, 1990.