State of art in the SIMS (Secondary Ion Mass Spectrometry) application to archaeometry studies

Macromolecular Symposia

Volumn 238, Issue , 2006, Pages 11-15

  Anderle, Mariano ^a   Bersani, Massimo ^a   Vanzetti, Lia ^a   Pederzoli, Simone ^a  

^a ITC IRST   (Italy)

Author keywords

Amorphous; ESCA XPS; Mass spectrometry

Indexed keywords

CONSERVATION; MICROANALYSIS; PROBLEM SOLVING; RESEARCH AND DEVELOPMENT MANAGEMENT; SECONDARY ION MASS SPECTROMETRY; STRATEGIC PLANNING; TECHNICAL PRESENTATIONS;

ARCHAEOMETRY STUDIES; CONSERVATION ISSUES; CULTURAL HERITAGES;

INDUSTRIAL MANAGEMENT;

EID: 33745155438     PISSN: 10221360     EISSN: 15213900     Source Type: Journal    
DOI: 10.1002/masy.200650602     Document Type: Conference Paper

References (8)

1. S. Fearn, D.S. McPhail, B. Hagenhoff, E. Tallarek, Proceedings of SIMS XV 2005.
2. M.G. Dowsett, A. Adriaens, M. Soares, H. Wouters, V.V.N. Palitsin, R. Gibbons, R.J.H. Morris, Nucl. Instr. and Meth. In Phys. Res. B 239, 2005, 51-64.
3. K. Keune thesis http://www.amolf.nl/publications/theses/keune/keune.html.
4. + per la caratterizzazione di materiali per la microelettronica" Vuoto XXIX, n. 3-4, 2000, 3-10.
5. +", J. Appl. Phys. 64, 1998, 3760.
6. R.G. Wilson, F.A. Stevie, C.W. Magee, "Secondary Ion Mass Spectrometry-A Pratical Handbook for Depth Profiling and Bulk Impurity Analysis" John Wiley & Sons, New York, 1989, 1.2.
7. th International Conference on "Non-Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage", Lecce, 15-19 May 2005.
8. F. Fiori, G. Giunta, N. Kardjilov, R. Rustichelli, "Neutron Tomography Investigation of Archaeological Classes", presented at Congresso Nazionale I.N.F.M., Geneva, June 8-10 2004.