Main effect fine-tuning of the mutation operator and the neighbourhood function for uncapacitated facility location problems

Soft Computing

Volumn 10, Issue 11, 2006, Pages 1075-1090

  Chan, Kit Yan ^a   Aydin, M Emin ^a   Fogarty, Terence C ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

Genetic algorithm; Main effect; Mutation rate; Simulated annealing; Uncapacitated facility location problem

Indexed keywords

EID: 33745149281     PISSN: 14327643     EISSN: 14337479     Source Type: Journal    
DOI: 10.1007/s00500-005-0044-4     Document Type: Article

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