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Volumn 45, Issue 6, 1980, Pages 494-497
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New method for high-accuracy determination of the fine-structure constant based on quantized hall resistance
a,b c d
c
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33745141474
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.45.494 Document Type: Article |
Times cited : (6320)
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References (14)
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