CRAL activities on advanced image slicers: Optical design, manufacturing, assembly, integration and testing

New Astronomy Reviews

Volumn 50, Issue 4-5, 2006, Pages 346-350

  Laurent, Florence ^a,b   Hénault, François ^a   Ferruit, Pierre ^a   Prieto, Eric ^c   Robert, Daniel ^a   Renault, Edgard ^a   Dubois, Jean Pierre ^a   Bacon, Roland ^a  

^a OBSERVATOIRE DE LYON   (France)

^b Cybernetix SA   (France)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Metrology; Optical system design; Optical testing techniques; Spectroscopy

Indexed keywords

EID: 33745066863     PISSN: 13876473     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.newar.2006.02.013     Document Type: Review

References (6)

1. Hénault, et al. Proc. SPIE 5249 (2003) 134
2. Laurent, et al. Proc. SPIE 5494 (2004) 196
3. Laurent, et al. Proc. SPIE 5252 (2004) 443
4. Laurent, et al. Proc. SPIE 5965 (2005) 184
5. Lefèvre, et al. ASP Conf. 195 (2000) 431
6. Prieto, et al. Proc. SPIE 4850 (2003) 486