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Volumn 352, Issue 1-3, 2006, Pages 36-41

In situ creep under helium implantation of titanium-aluminium alloy

Author keywords

C1100; H0200; M0400; R0200

Indexed keywords

ALUMINUM ALLOYS; HELIUM; INTERMETALLICS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33745056034     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2006.02.039     Document Type: Article
Times cited : (18)

References (20)
  • 1
    • 33745052036 scopus 로고    scopus 로고
    • A Technology Roadmap for Generation IV Nuclear Energy System, Issued by the US DOE Nuclear Energy Research Advisory Committee and the Generation IV International Forum, GIF-002-00, December 2002.
  • 2
    • 33745054309 scopus 로고    scopus 로고
    • M. Nazmy, M. Staubli, US Patent 5,207,982 & EP. 45505 B1.
  • 19
    • 33745012553 scopus 로고    scopus 로고
    • H. Ullmaier, W. Schilling, Radiation Damage in Metallic Reactor Materials in 'Physics of Modern Materials', vol. 1, International Atomic Energy Agency, Vienna, 1980, p. 301.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.