Concentration evaluation method using broadband absorption spectroscopy for sulfur dioxide monitoring

Applied Physics Letters

Volumn 88, Issue 23, 2006, Pages

  Xu, F ^a   Lv, Z ^a   Zhang, Y G ^a   Somesfalean, G ^a,b   Zhang, Z G ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b LUND INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATMOSPHERIC PRESSURE; DATA PROCESSING; EVALUATION; REAL TIME SYSTEMS; ULTRAVIOLET SPECTROSCOPY;

BROADBAND ABSORPTION SPECTROSCOPY; OPTICAL DETECTION TECHNIQUES; ULTRAVIOLET SPECTRAL RANGE;

SULFUR DIOXIDE;

EID: 33745023794     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2211299     Document Type: Article

References (19)

1. J. Alnis, U. Gustafsson, G. Somesfalean, and S. Svanberg, Appl. Phys. Lett. 76, 1234 (2000).
2. L. S. Rothman, C. P. Rinsland, A. Goldman, S. T. Massie, D. P. Edwards, J.-M. Flaud, A. Perrin, C. Camy-Peyret, V. Dana, J.-Y. Mandin, J. Schroeder, A. McCann, R. R. Gamache, R. B. Wattson, K. Yoshino, K. V. Chance, K. W. Jucks, L. R. Brown, V. Nemtchinov, and P. Varanasi, J. Quant. Spectrosc. Radiat. Transf. 60, 665 (1998).
3. EU Council Directive 1999/30/EC relating to limit values for sulphur dioxide, nitrogen dioxide and oxides of nitrogen, particulate matter, and lead in ambient air (1999).
4. T. M. A. Razek, M. J. Miller, S. S. M. Hassan, and M. A. Arnold, Talanta 50, 491 (1999).
5. B. L. Walker and C. D. Copper, J. Air Waste Manage. Assoc. 6, 784 (1992).
6. U. Platt, in Air Monitoring by Spectroscopic Techniques, edited by, M. W. Sigrist, (Wiley, New York, 1994), pp. 27-84.
7. H. Edner, P. Ragnarson, S. Spännare, and S. Svanberg, Appl. Opt. 32, 327 (1993).
8. M. M. Millan and R. M. Hoff, Atmos. Environ. 12, 853 (1978).
9. P. Weibring, H. Edner, S. Svanberg, G. Cecchi, L. Pantani, R. Ferrara, and T. Caltabiano, Appl. Phys. B: Lasers Opt. 67, 419 (1998).
10. H. Edner, K. Fredriksson, A. Sunesson, S. Svanberg, L. Uńus, and W. Wendt, Appl. Opt. 26, 4330 (1987).
11. P. Weibring, H. Edner, and S. Svanberg, Appl. Opt. 42, 3583 (2003).
12. P. Weibring, J. Swartling, H. Edner, S. Svanberg, T. Caltabiano, D. Condarelli, G. Cecchi, and L. Pantani, Opt. Lasers Eng. 37, 267 (2002).
13. G. Somesfalean, Z. G. Zhang, M. Sjöholm, and S. Svanberg, Appl. Phys. B: Lasers Opt. 80, 1021 (2005).
14. S. Svanberg, Atomic and Molecular Spectroscopy: Basic Aspects and Practical Applications (Springer, Heidelberg, 2004), pp. 164-165.
15. A. C. Vandaele, P. C. Simon, J. M. Guilmot, M. Carleer, and R. Colin, J. Geophys. Res. 99, 25599 (1994).
16. D. J. Brassington, Laboratory Note No. RD/L/N 184/79 (Central Electricity Research Laboratories, Leatherhead, 1979).
17. D. J. Brassington, Appl. Opt. 20, 3774 (1981).
18. www.testo.com
19. F. Xu, Y. G. Zhang, G. Somesfalean, Z. G. Zhang, H. S. Wang, and S. H. Wu (unpublished).