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Volumn 203, Issue 7, 2006, Pages 1778-1782

Towards identification of degradation mechanisms in InGaN laser diodes grown on bulk GaN crystals

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DIFFUSION; DISLOCATION DENSITY; MONOCRYSTALINE SUBSTRATES; SQUARE ROOT DEPENDENCE;

EID: 33745011893     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200565316     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.