|
Volumn 480-481, Issue , 2005, Pages 231-236
|
Non-destructive observation of damage processes in loaded high ductile specimens with different crack configuration by X-ray dynamic defectoscopy
c
NIKHEF
(Netherlands)
|
Author keywords
Defectoscopy; Digital roentgenography; Fracture mechanics; Materials science; Semiconductor detectors
|
Indexed keywords
CRACKS;
FRACTURE MECHANICS;
NONDESTRUCTIVE EXAMINATION;
SEMICONDUCTOR DETECTORS;
DEFECTOSCOPY;
DIGITAL ROENTGENOGRAPHY;
INTERPOLATED ELLIPSES;
MATERIALS SCIENCE;
|
EID: 33745003100
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-962-8.231 Document Type: Conference Paper |
Times cited : (5)
|
References (7)
|