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Volumn 44, Issue 14, 2006, Pages 2935-2954

Applying a hybrid data-mining approach to prediction problems: A case of preferred suppliers prediction

Author keywords

Feature selection; Negative information; Preferred suppliers prediction; Rough set theory; Support vector machines

Indexed keywords

DATABASE SYSTEMS; DECISION MAKING; INFORMATION RETRIEVAL; MATHEMATICAL MODELS; PROBLEM SOLVING; RANDOM PROCESSES; ROUGH SET THEORY;

EID: 33744986720     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540600654525     Document Type: Article
Times cited : (23)

References (20)
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  • 4
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    • Determining the importance of the supplier selection process in manufacturing: A case study
    • Gon, A., Lez, M.E., Quesada, G., Monge, M. and Carlo, A., Determining the importance of the supplier selection process in manufacturing: a case study. Int. J. Phys. Distrib. Logist. Manag., 2004, 34, 492-504.
    • (2004) Int. J. Phys. Distrib. Logist. Manag. , vol.34 , pp. 492-504
    • Gon, A.1    Lez, M.E.2    Quesada, G.3    Monge, M.4    Carlo, A.5
  • 5
    • 0036505670 scopus 로고    scopus 로고
    • A comparison of methods for multi-class support vector machines
    • Hsu, C.-W. and Lin, C.-J., A comparison of methods for multi-class support vector machines. IEEE Trans. Neural Network., 2003, 13, 415-425.
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    • Hsu, C.-W.1    Lin, C.-J.2
  • 6
    • 0348231940 scopus 로고    scopus 로고
    • Rough set approach to case-based reasoning
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    • Huang, C.C.1    Tseng, B.2
  • 9
    • 0035401581 scopus 로고    scopus 로고
    • Feature transformation methods in data mining
    • Kusiak, A., Feature transformation methods in data mining. IEEE Trans. Electr. Packag. Manuf., 2001, 24, 214-221.
    • (2001) IEEE Trans. Electr. Packag. Manuf. , vol.24 , pp. 214-221
    • Kusiak, A.1
  • 10
    • 0034960598 scopus 로고    scopus 로고
    • Rough set theory: A data mining tool for semiconductor manufacturing
    • Kusiak, A., Rough set theory: a data mining tool for semiconductor manufacturing. IEEE Trans. Electr. Packag. Manuf., 2001b, 24, 44-50.
    • (2001) IEEE Trans. Electr. Packag. Manuf. , vol.24 , pp. 44-50
    • Kusiak, A.1
  • 11
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    • Data mining of printed circuit board defects
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  • 13
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  • 17
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    • Quality control problem in printed circuit board manufacturing - An extended rough set theory approach
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  • 19
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.