Influence of the electron irradiation in the SEM on terbium molybdate surface potential state

Ferroelectrics

Volumn 303, Issue , 2004, Pages 47-49

  Kokhanchik, L S ^a   Ponomarev, B K ^b  

^a INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

Scanning electron microscopy; Secondary electron emission; Surface potential state; Terbium molybdate

Indexed keywords

EID: 33744983688     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490456547     Document Type: Review

References (1)

1. Yu. Ya. Tomashpolsky, M. A. Sevostyanov, N. V. Sadovskaya, and N. V. Kolganova, New analytical prospects in methods of secondary electron emission from oxides. J. Microsc. Spectrosc. Electron. 14, 213-228 (1989).