Automatic correction of artifact from single-trial event-related potentials by blind source separation using second order statistics only

Medical Engineering and Physics

Volumn 28, Issue 8, 2006, Pages 780-794

  Ting, K H ^a   Fung, P C W ^a   Chang, C Q ^a   Chan, F H Y ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Automatic artifact correction; Blind source separation (BSS); Electroencephalogram (EEG); Event related potential (ERP); Higher order statistics (HOS); Independent component analysis (ICA); Second order statistics (SOS)

Indexed keywords

BLIND SOURCE SEPARATION; DATA ACQUISITION; ELECTROENCEPHALOGRAPHY; INDEPENDENT COMPONENT ANALYSIS; MUSCLE; REGRESSION ANALYSIS; STATISTICAL METHODS;

AUTOMATIC ARTIFACT CORRECTION; EVENT-RELATED POTENTIAL (ERP); HIGHER ORDER STATISTICS (HOS); SECOND ORDER STATISTICS (SOS);

BIOLOGICAL MATERIALS;

AMPLITUDE MODULATION; ARTICLE; ELECTROOCULOGRAM; EVENT RELATED POTENTIAL; EYE MOVEMENT; MUSCLE ACTION POTENTIAL; PRIORITY JOURNAL; SIGNAL TRANSDUCTION;

ALGORITHMS; ARTIFACTS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; DIAGNOSIS, COMPUTER-ASSISTED; ELECTROENCEPHALOGRAPHY; EVOKED POTENTIALS, VISUAL; HUMANS; MODELS, NEUROLOGICAL; MODELS, STATISTICAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; VISUAL CORTEX;

EID: 33744979251     PISSN: 13504533     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.medengphy.2005.11.006     Document Type: Article

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