Evidence for the chemical nature of capping in CdSe nanoparticles

Journal of Surface Science and Technology

Volumn 21, Issue 1-2, 2005, Pages 11-22

  Lahiri, Debdutta ^a   Sharma, Shailesh N ^b,c   Zeena, S ^b   Bunker, Bruce A ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

^c NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

Extended X ray absorption fine structure; Nanoparticles; Semiconductor materials; Topo capping

Indexed keywords

EID: 33744975002     PISSN: 09701893     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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