Measurement of Dielectric Polarizations for Analyzing the Orientational Order of Langmuir Monolayers

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 284-285, Issue , 2006, Pages 147-153

  Wagner, Robert ^a   Yamamoto, Tetsuya ^a   Manaka, Takaaki ^a   Iwamoto, Mitsumasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Dielectric polarization measurement; Langmuir monolayer; Orientational order parameter

Indexed keywords

DIELECTRIC PROPERTIES; MOLECULAR ORIENTATION; POLARIZATION; SECOND HARMONIC GENERATION;

BREWSTER ANGLE REFLECTOMETRY (BAR); DIELECTRIC POLARIZATION MEASUREMENT; LANGMUIR MONOLAYER; MAXWELL DISPLACEMENT CURRENT (MDC); ORIENTATIONAL ORDER PARAMETER;

MONOLAYERS;

ANALYTIC METHOD; ARTICLE; LANGMUIR BLODGETT FILM; MEASUREMENT; MOLECULE; ORIENTATION; PARAMETER; PHYSICAL CHEMISTRY; POLARIZATION; PRIORITY JOURNAL; REFLECTOMETRY; STRUCTURE ANALYSIS; THERMODYNAMICS;

EID: 33744934237     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2005.10.084     Document Type: Article

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