Deflectometric measurement of specular surfaces

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2005, Pages 531-536

  Kammel, S ^a   Puente Leon, F ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Curvature measurement; Deflectometry; Inspection; Specular surfaces; Triangulation

Indexed keywords

CURVATURE MEASUREMENT; DEFLECTOMETRY; SPECULAR SURFACES;

DEFECTS; MEASUREMENT THEORY; MIRRORS; TRIANGULATION;

SURFACE PROPERTIES;

EID: 33744926293     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.1999.776808     Document Type: Conference Paper

References (7)

1. B. Denkena, H. Ahlers, F. Berg, T. Wolf, "Fast inspection of larger sized curved surfaces by stripe projection," Annals of the CIRP, vol. 51/2, pp. 499-502, 2002.
2. J. Beyerer, D. Pérard, "Automatische Inspektion spiegelnder Freiform-flächen anhand von Rasterreflexionen," Technisches Messen, vol. 64, pp. 394-400, 1997.
3. D. Pérard, Automated Visual Inspection of Specular Surfaces with Structured-Lighting Reflection Techniques, Fortschritt-Berichte VDI, Reihe 8, Nr. 869, VDI Verlag, Düsseldorf, 2001.
4. G. Farin, Curves and Surfaces for Computer Aided Geometric Design, Academic Press, London, 1997.
5. M. Fischler, R. Bolles, "Random Sample Consensus: A Paradigm for Model Fitting with Applications to Image Analysis and Automated Cartography," In: Communications of the ACM, No. 24, pp. 381-395, 1981.
6. K. Ireland, M. Rosen, "The Chinese Remainder Theorem," In: A Classical Introduction to Modern Number Theory (2. Edition), pp. 34-38, Springer, New York, 1990.
7. P. J. Rousseeuw, A. M. Leroy, Robust Regression and Outlier Detection, Wiley & Sons, Hoboken, NJ, 2003.