Microstructure effects on the electrochemical kinetics of vanadium pentoxide thin-film cathodes

Journal of the Electrochemical Society

Volumn 153, Issue 7, 2006, Pages

  Mui, Simon C ^a   Jasinski, Jacek ^b   Leppert, Valerie J ^b   Mitome, Masanori ^c   Sadoway, Donald R ^a,d   Mayes, Anne M ^a,d  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b University of California   (United States)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d ELECTROCHEMICAL SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL KINETICS; INTERFACIAL IMPEDANCES; PHASE TRANSFORMATION; VANADIUM PENTOXIDE;

ANNEALING; ELECTROCHEMICAL ELECTRODES; GRAIN BOUNDARIES; MICROSTRUCTURE; REACTION KINETICS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

CATHODES;

EID: 33744909824     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2199327     Document Type: Article

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