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Volumn 47, Issue 13, 2006, Pages 4768-4772

Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using reflectance difference spectroscopy

Author keywords

Oriented polymers; Poly(ethylene terephthalate); Reflectance difference spectroscopy

Indexed keywords

ANISOTROPY; ELECTROMAGNETIC WAVE REFLECTION; ELLIPSOMETRY; MOLECULAR ORIENTATION; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 33744908286     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2006.04.061     Document Type: Article
Times cited : (11)

References (13)
  • 4
    • 0003681123 scopus 로고
    • X-ray scattering of synthetic polymers
    • Amsterdam, Elsevier
    • Balta-Calleja F., and Vonk C. X-ray scattering of synthetic polymers. Polymer Science Library (1989), Amsterdam, Elsevier
    • (1989) Polymer Science Library
    • Balta-Calleja, F.1    Vonk, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.