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Volumn 16, Issue 22, 2006, Pages 2181-2191

Examination of the interlayer strength of smectic liquid crystals through the study of partially fluorinated and branched fluorinated end-groups

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL MATERIALS; FERROELECTRIC MATERIALS; HALOGENATION; SUPERCONDUCTING TRANSITION TEMPERATURE; SWITCHING; X RAY DIFFRACTION ANALYSIS;

EID: 33744821874     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/b517913k     Document Type: Article
Times cited : (25)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.