Effect of sulfurization conditions and post-deposition annealing treatment on structural and electrical properties of silver sulfide films

Journal of Applied Physics

Volumn 99, Issue 10, 2006, Pages

  Kundu, Manisha ^a   Terabe, Kazuya ^a   Hasegawa, Tsuyoshi ^a   Aono, Masakazu ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC PROPERTIES; POLARIZATION; SILVER COMPOUNDS; STOICHIOMETRY;

POST-DEPOSITION ANNEALING; SILVER SULFIDE FILMS; SULFURIZATION;

THIN FILMS;

EID: 33744810915     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2199067     Document Type: Article

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