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Volumn 37, Issue 10, 2005, Pages 42-44
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Focus on microscopy: AFM's new nanotomography expands 3-D imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33744809546
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (2)
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