Effects of dissolved oxygen on passive behavior of stainless alloys

Corrosion Science

Volumn 48, Issue 7, 2006, Pages 1623-1638

  Raja, K S ^a   Jones, D A ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

Charge carrier density; Nickel base Alloy 22; Passive film; Semiconductor properties

Indexed keywords

CHARGE CARRIERS; CORROSION; DISSOLUTION; GROWTH KINETICS; MATHEMATICAL MODELS; OXYGEN; PASSIVATION; SULFURIC ACID;

CHARGE CARRIER DENSITY; NICKEL BASE ALLOY-22; PASSIVE FILMS; SEMICONDUCTOR PROPERTIES;

ALLOYS;

ALLOYS; CHARGE CARRIERS; CORROSION; DISSOLUTION; GROWTH KINETICS; MATHEMATICAL MODELS; OXYGEN; PASSIVATION; SULFURIC ACID;

EID: 33744802331     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2005.05.048     Document Type: Article

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