Adaptive multiscale detection of filamentary structures in a background of uniform random points

Annals of Statistics

Volumn 34, Issue 1, 2006, Pages 326-349

  Arias Castro, Ery ^a   Donoho, David L ^b   Huo, Xiaoming ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Georgia Institute of Technology   (United States)

Author keywords

Beamlets; Erd s R nyi laws; Good continuation; Multiscale geometric analysis; Pattern recognition; Runs test

Indexed keywords

EID: 33744797958     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/009053605000000787     Document Type: Article

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