Simplified spectral phase interferometry for direct electric-field reconstruction by using a thick nonlinear crystal

Optics Letters

Volumn 31, Issue 7, 2006, Pages 1008-1010

  Radunsky, Aleksander S ^a,b   Williams, Ellen M Kosik ^a,b,f   Walmsley, Ian A ^a,b   Wasylczyk, Piotr ^c   Wasilewski, Wojciech ^c   U'Ren, Alfred B ^d   Anderson, Matthew E ^e  

^a UNIVERSITY OF ROCHESTER   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF WARSAW   (Poland)

^d CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^e SAN DIEGO STATE UNIVERSITY   (United States)

^f Corning Incorporated ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD RECONSTRUCTION; SPECTRAL PHASE INTERFEROMETRY (SSI); SPECTRAL SHEAR; THICK NONLINEAR CRYSTALS;

CRYSTAL STRUCTURE; ELECTRIC FIELDS; INTERFEROMETRY; SHEAR DEFORMATION; ULTRASHORT PULSES;

WAVE INTERFERENCE;

EID: 33744794328     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.31.001008     Document Type: Article

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