The characterisation of rough particle contacts by atomic force microscopy

Journal of Colloid and Interface Science

Volumn 299, Issue 2, 2006, Pages 665-672

  George, M ^a   Goddard, D T ^b  

^a UNIV MONTPELLIER   (France)

^b NATIONAL NUCLEAR LABORATORY   (United Kingdom)

Author keywords

Adhesion; Atomic force microscopy; Contact radius; Surface roughness

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; GLASS; GRANULAR MATERIALS; MATHEMATICAL MODELS; MEDICINE; MICA; ORE PELLETS; SURFACE ROUGHNESS;

ASPERITY RADIUS; CONTACT MECHANICS; CONTACT RADIUS; TABLET MANUFACTURE;

ELEMENTARY PARTICLES;

GLASS;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DRUG COATING; MOLECULAR MECHANICS; PARTICLE SIZE; PELLET EXTRUSION; POROSITY; PRIORITY JOURNAL; SURFACE PROPERTY; TOPOGRAPHY;

EID: 33744775063     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2006.03.021     Document Type: Article

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