Detecting improvement using Shewhart attribute control charts when the lower control limit is zero

IIE Transactions (Institute of Industrial Engineers)

Volumn 38, Issue 8, 2006, Pages 699-709

  Lucas, James M ^a   Davis, Darwin J ^b   Saniga, Erwin M ^b  

^a JM Lucas and Associates   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURING DATA PROCESSING; PROCESS ENGINEERING; PRODUCTION CONTROL; QUALITY ASSURANCE;

CONTROL LIMIT; DETECTION FREQUENCIES; SHEWHART CONTROL CHART;

STATISTICAL PROCESS CONTROL;

EID: 33744748543     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/07408170600692317     Document Type: Article

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