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Volumn 26, Issue 7, 2000, Pages 502-507
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Break-junction experiments on the Kondo semiconductor CeNiSn: Tunnelling versus direct conductance
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Author keywords
[No Author keywords available]
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Indexed keywords
CERIUM ALLOYS;
POINT CONTACTS;
RARE EARTHS;
SCANNING TUNNELING MICROSCOPY;
TERNARY ALLOYS;
TIN ALLOYS;
KONDO SEMICONDUCTORS;
MECHANICALLY CONTROLLABLE BREAK JUNCTIONS;
METALLIC PROPERTIES;
SEMICONDUCTING BEHAVIOR;
SPECTRAL FEATURE;
TUNNELING REGIME;
TUNNELING SPECTROSCOPY;
ZERO-BIAS CONDUCTANCE;
SEMICONDUCTOR JUNCTIONS;
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EID: 33744703261
PISSN: 1063777X
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1306407 Document Type: Article |
Times cited : (2)
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References (15)
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