Compton backscattering focused x-ray source for advanced biomedical applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2988, Issue , 1997, Pages 52-63

  Hartemann, Frederic V ^a,b   Chu, Tak S ^b   Troha, Anthony L ^a   Van Meter, J R ^a   Le Sage, Gregory P ^c   Bennett, Corey V ^c   Dinh, Victor ^a   Kolner, Brian H ^a   Heritage, Jonathan P ^d   Baldis, Hector A ^a,e   Luhmann Jr , Neville C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Nonlinear Technologies   (United States)

^c University of California   (United States)

^d University of California   (United States)

^e LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Compton scattering; Free electron lasers; Nonlinear Doppler effect; Nonlinear optics; Optical chaos; Radiation by moving charges

Indexed keywords

BIREFRINGENCE; COMPTON SCATTERING; DOPPLER EFFECT; ELECTRON BEAMS; ELECTRONS; LASER BEAMS; LASER PULSES; LASERS; LIGHT; MODULATION; NONLINEAR OPTICS; OPTICAL MATERIALS; OPTICAL PROPERTIES; PHOTOLITHOGRAPHY; PULSED LASER APPLICATIONS; SCATTERING; WAVES;

AXIAL VELOCITIES; BACK SCATTERED; BIOMEDICAL APPLICATIONS; CHIRPED PULSES; COLLIDER; COMPTON BACKSCATTERINGS; DOPPLER; FOURIER PLANES; FREE-ELECTRON LASERS; HIGH CONTRAST RATIOS; HYPERBOLIC SECANTS; LASER PULSE SHAPES; LASER PULSE SHAPING; LASER WAVES; NONLINEAR DOPPLER EFFECT; OPTICAL CHAOS; OPTICAL PULSES; PRACTICAL IMPLEMENTATIONS; RADIATION PRESSURES; SPECTRAL FILTERS; SPECTRAL LINES; SQUARE PULSES; ULTRAHIGH INTENSITIES; VECTOR POTENTIALS;

INTEGRATED OPTOELECTRONICS;

EID: 33744596195     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.274398     Document Type: Conference Paper

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