Wafer lot output time prediction with a hybrid artificial neural network

WSEAS Transactions on Computers

Volumn 5, Issue 5, 2006, Pages 817-823

  Chen, Toly ^a   Tsai, Horng Ren ^b   Wu, Hsin Chieh ^c  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b LING TUNG UNIVERSITY   (Taiwan)

^c CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Fuzzy back propagation network; Output time prediction; Self organization map; Wafer fab

Indexed keywords

BACKPROPAGATION; DECISION SUPPORT SYSTEMS; FUZZY SETS; SELF ORGANIZING MAPS; SILICON WAFERS; TIME DOMAIN ANALYSIS;

CASE-BASED REASONING; CHEN'S FUZZY BACK PROPAGATION NETWORK; EVOLVING FUZZY RULES; ROOT-MEAN-SQUARED-ERROR; WAFER LOT OUTPUT TIME PREDICTION;

COMPUTER AIDED DESIGN;

EID: 33744527187     PISSN: 11092750     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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