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Volumn 41, Issue 9, 2006, Pages 2691-2702

The weak-beam technique applied to the analysis of materials properties

(1)  Veyssiere P a  

a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); IMAGE ANALYSIS;

EID: 33744519315     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-7872-1     Document Type: Conference Paper
Times cited : (15)

References (44)
  • 2
    • 0017634334 scopus 로고
    • The high resolution imaging of defects
    • Institute of Physics, London
    • C. J. HUMPHREYS and R. A. DRUMMOND, "The High Resolution Imaging of Defects, in Electron Microscopy and Analysis" (Institute of Physics, London, 1977) p. 241.
    • (1977) Electron Microscopy and Analysis , pp. 241
    • Humphreys, C.J.1    Drummond, R.A.2
  • 6
    • 33744534100 scopus 로고
    • The use of weak-beam dark-field TEM in the analysis of defects in intermetallics
    • edited by E. Bailey (San Francisco Press: San Francisco)
    • P. VEYSSIÈRE and G. HUG, "The Use of Weak-Beam Dark-Field TEM in the Analysis of Defects in Intermetallics, in XIIth International Congress for Electron Microscopy", edited by E. Bailey (San Francisco Press: San Francisco, 1990) p. 450.
    • (1990) XIIth International Congress for Electron Microscopy , pp. 450
    • Veyssière, P.1    Hug, G.2
  • 27
    • 33744533474 scopus 로고    scopus 로고
    • C. BONTEMPS-NEVEU (University of Paris-Sud, 1991)
    • C. BONTEMPS-NEVEU (University of Paris-Sud, 1991).
  • 28
    • 33744510216 scopus 로고    scopus 로고
    • J. OLIVER (University of Paris-Sud., 1991)
    • J. OLIVER (University of Paris-Sud., 1991).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.