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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1851-1854

Proton-induced degradation of thin-film microcrystalline silicon solar cells

Author keywords

Absorbtion; Defects; FTIR measurements; Microcrystallinity; Optical spectroscopy; Radiation; Silicon; Solar cells

Indexed keywords

ABSORPTION; ANNEALING; CRYSTALLINE MATERIALS; DEFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PROTON IRRADIATION; PROTONS; RADIATION; SOLAR CELLS; THIN FILMS;

EID: 33744516496     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.11.091     Document Type: Article
Times cited : (7)

References (10)
  • 1
    • 33744523884 scopus 로고    scopus 로고
    • S. Guha et al., J. Yang, A. Banerjee, T. Glatfelder, G.J. Vendura, A. Garcia, M. Kruer, in: Proc. of the 2nd WCPEC, Vienna, Austria, 1998, p. 3609.
  • 3
    • 33744550583 scopus 로고    scopus 로고
    • G.J. Vendura Jr., C.M.C. Toporow, M.A. Kruer, in: Proc. of the 2nd WCPEC, Vienna, Austria, 1998, p. 3745.
  • 4
    • 27944465365 scopus 로고    scopus 로고
    • F. Meillaud, E. Vallat-Sauvain, X. Niquille, M. Duubey, J. Bailat, A. Shah, C. Ballif, in: Proc. of the 31st IEEE, Orlando, FL, USA, 2005, p. 1412.
  • 5
    • 33744516358 scopus 로고    scopus 로고
    • N. Wyrsch, C. Miazza, S. Dunand, C. Ballif, A. Shah, M. Despeisse, D. Moraes, P. Jarron, in: Proc. of the Mater. Res. Soc. Spring Meeting, San Francisco, April 2005, MRS vol. 862, 2005, A15-4.
  • 9
    • 33744509392 scopus 로고    scopus 로고
    • J. Bailat, A. Poruba, L. Mullerova, J. Springer, M. Vanecek, E. Vallat-Sauvain, F. Meillaud, X. Niquille, M. Dubey, S. Rosset, J. Guillet, L. Feitknecht, A. Shah, in: Proc. of the 19th EUPVSC, Paris, France, 2004, p. 1541.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.