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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1851-1854
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Proton-induced degradation of thin-film microcrystalline silicon solar cells
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Author keywords
Absorbtion; Defects; FTIR measurements; Microcrystallinity; Optical spectroscopy; Radiation; Silicon; Solar cells
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Indexed keywords
ABSORPTION;
ANNEALING;
CRYSTALLINE MATERIALS;
DEFECTS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
PROTON IRRADIATION;
PROTONS;
RADIATION;
SOLAR CELLS;
THIN FILMS;
FTIR MEASUREMENTS;
MICROCRYSTALLINITY;
OPTICAL SPECTROSCOPY;
PROTON-INDUCED DEGRADATION;
SEMICONDUCTING SILICON;
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EID: 33744516496
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2005.11.091 Document Type: Article |
Times cited : (7)
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References (10)
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