ADC testing - Part 7 in a series of tutorials in instrumentation and measurements

IEEE Instrumentation and Measurement Magazine

Volumn 9, Issue 2, 2006, Pages 39-49

  Linnenbrink, Thomas E ^a   Blair, Jerome ^a   Rapuano, Sergio ^a   Daponte, Pasquale ^b   Balestrieri, Eulalia ^a   De Vito, Luca ^a   Max, Solomon ^c   Tilden, Steven J ^d  

^a Hittite Microwave ^*

^b UNIVERSITY OF SANNIO   (Italy)

^c LTX Corporation   (United States)

^d TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG-TO-DIGITAL CONVERTERS; HISTOGRAM METHOD; INSTRUMENTATION;

INSTRUMENTS; MEASUREMENTS; TESTING; WAVEFORM ANALYSIS;

ANALOG TO DIGITAL CONVERSION;

EID: 33744511909     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE Std 1241-2000.
2. International Vocabulary of Basic and General Terms in Metrology (VIM), ISO, 1993.
3. S. Rapuano, P. Daponte, E. Balestrieri, L. DeVito, S.J. Tilden, S. Max, and J. Blair, "ADC parameters and characteristics," IEEE Instrum. Meas. Mag., vol. 8, no. 5, pp. 44-54, Dec. 2005.