Electric-field-dependent spectroscopy of charge motion using a single-electron transistor

Applied Physics Letters

Volumn 88, Issue 21, 2006, Pages

  Brown, K R ^a   Sun, L ^a   Kane, B E ^a  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AL-AL OX -AL; BACKGROUND CHARGE FLUCTUATORS; SISI O2 INTERFACE;

CRYSTAL DEFECTS; ELECTRIC CHARGE; ELECTRIC FIELDS; SEMICONDUCTOR DOPING; SUBSTRATES;

FIELD EFFECT TRANSISTORS;

EID: 33744507712     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2207557     Document Type: Article

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