Effects of uniaxial stress on dielectric properties of ferroelectric ceramics

Current Applied Physics

Volumn 6, Issue 3, 2006, Pages 520-524

  Yimnirun, Rattikorn ^a   Wongsaenmai, Supattra ^a   Ngamjarurojana, Athipong ^a   Ananta, Supon ^a  

^a CHIANG MAI UNIVERSITY   (Thailand)

Author keywords

Dielectric properties; Ferroelectric; PMN PZT; Uniaxial stress

Indexed keywords

COMPOSITION; DIELECTRIC LOSSES; FERROELECTRICITY; PERMITTIVITY; PEROVSKITE; STRESSES;

DEPOLING MECHANISMS; MIXED-OXIDES METHOD; OXYGEN STOICHIOMETRY; PMN-PZT;

FERROELECTRIC CERAMICS;

EID: 33744505580     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.11.053     Document Type: Article

References (18)

1. Cross L.E. Mater. Chem. Phys. 43 (1996) 108
2. Murty K.V.R., Murty S.N., Mouli K.C., and Bhanumathi A. Proc. IEEE ISAF 1 (1992) 144
3. Yoo J.H., Yoon H.S., Jeong Y.H., and Park C.Y. Proc. IEEE Ultra. Symp. 1 (1998) 981
4. Viehland D., and Powers J. J. Appl. Phys. 89 (2001) 1820
5. Zhao J., Glazounov A.E., and Zhang Q.M. Appl. Phys. Lett. 74 (1999) 436
6. Gupta S.M., and Kulkarni A.R. Mater. Chem. Phys. 39 (1994) 98
7. Cross L.E. Ferroelectrics 76 (1987) 241
8. Ouchi H. J. Am. Ceram. Soc. 51 (1968) 169
9. Abe Y., Yanagisawa Y., Kakagawa K., and Sasaki Y. Solid State Commun. 113 (2000) 331
10. Yimnirun R., Ananta S., and Laoratanakul P. Mater. Sci. Eng. B 112 (2004) 79
11. Swartz S.L., and Shrout T.R. Mater. Res. Bull. 17 (1982) 1245
12. Yimnirun R., Moses P.J., Meyer R.J., and Newnham R.E. Rev. Sci. Instrum. 74 (2003) 3429
13. Ouchi H., Nagano K., and Hayakawa S.J. J. Am. Ceram. Soc. 48 (1965) 630
14. Koval V., Alemany C., Briancin J., Brunckova H., and Saksl K. J. Euro. Ceram. Soc. 23 (2003) 1157
15. Zhang Q.M., Zhao J., Uchino K., and Zheng J. J. Mater. Res. 12 (1997) 226
16. Yang G., Liu S.F., Ren W., and Mukherjee B.K. Proc. SPIE Symp. Smart Struct. Mater. 3992 (2000) 103
17. Yang G., Ren W., Liu S.F., Masys A.J., and Mukherjee B.K. Proc. IEEE Ultra. Symp. 1 (2000) 1005
18. Zhao J., Zhang Q.M., and Mueller V. Proc. IEEE ISAF 1 (1998) 361