Electrorheological fluid under elongation, compression, and shearing

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 65, Issue 3, 2002, Pages

  Tian, Y ^a   Meng, Y ^a   Mao, H ^a   Wen, S ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION TESTING; ELECTRIC FIELD EFFECTS; FLUIDS; RHEOLOGY; RHEOMETERS; SHEAR STRESS; SHEARING; SILICONES; STRAIN; TENSILE TESTING; VISCOSITY; ZEOLITES;

DC ELECTRIC FIELDS; ELECTRORHEOLOGICAL FLUIDS; ELONGATION; SHEAR YIELD STRESS;

INTELLIGENT MATERIALS;

EID: 33646968598     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.65.031507     Document Type: Article

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