A novel on-chip diagnostic method to measure burn rates of energetic materials

Journal of Energetic Materials

Volumn 24, Issue 1, 2006, Pages 1-15

  Bhattacharya, Shantanu ^a   Gao, Yuanfang ^b   Apperson, Steven ^b   Subramaniam, Senthil ^b   Shende, Rajesh ^b   Gangopadhyay, Shubhra ^b   Talantsev, Evgueni ^c  

^a UNIVERSITY OF MISSOURI   (United States)

^b University of Missouri   (United States)

^c TEXAS TECH UNIVERSITY   (United States)

Author keywords

Burn rate; On chip diagonosis; Thermite nanoparticles

Indexed keywords

EID: 33646950919     PISSN: 07370652     EISSN: 15458822     Source Type: Journal    
DOI: 10.1080/07370650500374318     Document Type: Article

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