RIT American museums survey on digital imaging for direct capture of artwork

Archiving 2005 - Final Program and Proceedings

Volumn 2005, Issue , 2005, Pages 79-84

  Rosen, Mitchell R ^a,b,c,d   Frey, Franziska S ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b Munsell Color Science Laboratory   (United States)

^c Visual Perception Laboratory   (United States)

^d Center for Imaging Science at RIT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL PHOTOGRAPHY; RIT AMERICAN MUSEUMS SURVEY; ROCHESTER INSTITUTE OF TECHNOLOGY;

BENCHMARKING; COMPUTER NETWORKS; COMPUTER SOFTWARE; DIGITAL LIBRARIES; ONLINE SYSTEMS; PHOTOINTERPRETATION;

IMAGE PROCESSING;

EID: 33646948034     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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3. Rieger, O., Implementing a digital imaging and archiving program: technology meets reality, Proc. IS&T Archiving 2004, pp. 191-194 (2004).
4. Tsai, S. and Lin, W., The workflows of painting and calligraphy on digital archives - an example of Hwa-Kang Museum, (in Chinese), Proc. of the Digital Archives Conference on Workflows and Quality Management Proceedings, pp. 39-55 (2004).
5. Berns, R.S., Sneaking scientific validity into imaging tools for the masses. Proc. IS&T First European Conference on Color in Graphics, Imaging, and Vision, pp. 1-2 (2002).
6. Berns, R.S., The science of digitizing paintings for color-accurate image archives: a review, J. Imaging Sci. Technol. 45 pp. 373-383 (2001).
7. Waibel, G. and Dale, R. (2004). Automatic exposure: capturing technical metadata for digital still images. Proc. IS&T Archiving 2004, pp. 260-265 (2004).
8. NISO Z39.87, Technical Metadata for Digital Still Images. www.niso.org (2002).
9. Klijn, E, SEPIADES, Recommendations for Cataloguing Photographic Collections, European Commission on Preservation and Access, Amsterdam (2003).
10. F.S. Frey and S. Süsstrunk, Digital photography - how long will it last?, Proc. of IEEE ISACAS 2000, pp. V-113, (2000).