Smart temperature sensor for thermal testing of cell-based ICs

Proceedings -Design, Automation and Test in Europe, DATE '05

Volumn I, Issue , 2005, Pages 464-467

  Bota, S A ^a   Rosales, M ^a   Rossello J L ^a   Segura, J ^a  

^a UNIVERSITAT DE LES ILLES BALEARS   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC INVERTERS; INTEGRATED CIRCUITS; LOGIC GATES; OPTIMIZATION; TEMPERATURE MEASUREMENT; THERMAL EFFECTS; VLSI CIRCUITS;

NON-LINEARITY ERRORS; TEMPERATURE SENSORS; THERMAL MONITORING; THERMAL TESTING;

SENSORS;

EID: 33646929245     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.271     Document Type: Conference Paper

References (0)