Quick response observed in solid-state electrochromic device with interfacial barrier structure

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 4 B, 2006, Pages 3479-3481

  Yoshimura, Hideo ^a   Koshida, Nobuyoshi ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

Carrier accumulation; Electrochromism; Response time; Solid state electrolyte; Thin WO3 films

Indexed keywords

AMORPHOUS FILMS; DYNAMIC RESPONSE; ELECTROCHROMISM; INDIUM COMPOUNDS; SILICA; THIN FILMS;

CHARGE ACCUMULATION; RESPONSE TIME; SOLID-STATE ELECTROLYTE; THIN WO3 FILMS;

ELECTROCHROMIC DEVICES;

EID: 33646918882     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.3479     Document Type: Article

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