Locating dependence clusters and dependence pollution

IEEE International Conference on Software Maintenance, ICSM

Volumn 2005, Issue , 2005, Pages 177-186

  Binkley, David ^a   Harman, Mark ^b  

^a LOYOLA UNIVERSITY MARYLAND   (United States)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

Dependence analysis; Ripple effect; System dependence graph

Indexed keywords

COMPUTER APPLICATIONS; PROGRAM ASSEMBLERS;

CLUSTERS; DEPENDENCE ANALYSIS; DEPENDENCE POLLUTION; RIPPLE EFFECT; SYSTEM DEPENDENCE GRAPH;

COMPUTER SOFTWARE MAINTENANCE;

EID: 33646918077     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSM.2005.58     Document Type: Conference Paper

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