Modulated structure of misfit-layered compound [Bi2.08Sr 1.67Oy]0.54[CoO2]

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 5 A, 2006, Pages 4159-4164

  Yubuta, Kunio ^a   Begum, Shahnaz ^b   Ono, Yasuhiro ^b   Miyazaki, Yuzuru ^b   Kajitani, Tsuyoshi ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Electron diffraction; High resolution image; Misfit layered structure; Modulated structure; Residual strain; Shear deformation; Thermoelectric compound

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; SHEAR DEFORMATION; STRONTIUM COMPOUNDS; VECTORS;

HIGH-RESOLUTION IMAGE; MISFIT-LAYERED STRUCTURE; MODULATED STRUCTURE; THERMOELECTRIC COMPOUND;

BISMUTH COMPOUNDS;

EID: 33646893684     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.4159     Document Type: Article

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