Approach to measure plant leaf area based on image process

Jisuanji Gongcheng/Computer Engineering

Volumn 32, Issue 8, 2006, Pages 210-212

  Wang, Yongjiao ^a   Zhang, Yin ^a   Zhang, Sanyuan ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Image processing; Leaf area; Non destroyed measurement; Threshold

Indexed keywords

EID: 33646888661     PISSN: 10003428     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)