Improving test quality using robust unique input/output circuit sequences (UIOCs)

Information and Software Technology

Volumn 48, Issue 8, 2006, Pages 696-707

  Guo, Qiang ^a   Hierons, Robert M ^a   Harman, Mark ^b   Derderian, Karnig ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

B UIOs; Conformance test; F UIOs; Fault masking; FSMs; Test quality; UIOCs

Indexed keywords

ALGORITHMS; FINITE AUTOMATA; INPUT OUTPUT PROGRAMS; PROBLEM SOLVING; ROBUSTNESS (CONTROL SYSTEMS);

B-UIOS; CONFORMANCE TEST; F-UIOS; FAULT MASKING; FSMS;

NETWORKS (CIRCUITS);

EID: 33646857222     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2005.08.001     Document Type: Article

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